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 Home > Publication > Journals > 2012 (18) > (2012-12) Bias-Stress-Induced Charge Trapping at Polymer Chain-Ends of Polymer Gate-Dielectrics in Organic Transistors

(2012-12) Bias-Stress-Induced Charge Trapping at Polymer Chain-Ends of Polymer Gate-Dielectrics in Organic Transistors
Hyun Ho Choi, Wi Hyoung Lee, and Kilwon Cho* Adv. Funct. Mater. 2012, 22, 4833 (view at publisher)

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