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 Home > Publication > Journals > 2005 (21) > (2005-11) Layered silicate-induced enhancement of fracture toughness of epoxy molding compounds over a wide temperature range

(2005-12) Low-voltage polymer thin-film transistors with a self-assembled monolayer as the gate dielectric

Y.D.Park, D.H.Kim, Y.Jang, M.Hwang, J.A.Lim, K.Cho, Applied Physics Letters, 2005, 87, 243509 (view at publisher)

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