HOME  /  SEARCH  /  LOG IN  /  SIGN UP
Cover Gallery
Journals
2024 (11)
2023 (30)
2022 (24)
2021 (22)
2020 (38)
2019 (29)
2018 (33)
2017 (28)
2016 (27)
2015 (28)
2014 (21)
2013 (17)
2012 (18)
2011 (19)
2010 (17)
2009 (17)
2008 (19)
2007 (12)
2006 (20)
2005 (21)
1982 ~ 2004 (88)
Patents
Domestic
International
Books & Reviews
 
 Home > Publication > Journals > 2022 (24) > (2022-14) Fluorination-Induced Charge Trapping and Operational Instability in Conjugated-Polymer Field-Effect Transistors

(2022-14) Fluorination-Induced Charge Trapping and Operational Instability in Conjugated-Polymer Field-Effect Transistors
Hansol Lee¢Ó, Byungho Moon¢Ó, Min-Jae Kim, Hee Su Kim, Do-Hoon Hwang, Boseok Kang*, and Kilwon Cho*, ACS Appl. Mater. Interfaces, 2022, 14, 34, 39098–39108
¸ñ·Ïº¸±â 

À̵¿:  


ÀÌ¿ë¾à°ü | °³ÀÎÁ¤º¸Ãë±Þ¹æħ | À̸ÞÀÏÁÖ¼Ò¹«´Ü¼öÁý°ÅºÎ | û¼Ò³âº¸È£Á¤Ã¥ | Ã¥ÀÓÀÇÇÑ°è¿Í¹ýÀû°íÁö | °Ë»ö°á°ú¼öÁý°ÅºÎ
Department of Chemical Engineering, POSTECH, 67, Cheongam-ro, Pohang, 37673, KOREA Tel : 054-279-2932 Fax : 054-279-8298
Copyright © 2008 CRG All rights reserved / Manager : myjeong46@postech.ac.kr  / Supported by ONTOIN